See http://tny.im/pEd — For semiconductor device applications such as FinFET, MEMS, 2D materials, and wide bandgap materials, reliability is one of the most powerful key factors for commercialization in the industry. ZnGa2O4 deep ultraviolet (DUV) photodetectors (PDs) have been studied for their reliability and hence have been examined using the accelerated life test (ALT), which…
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